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Poster Fri, Jun 5, 2026 • 3:00 PM – 5:00 PM PDT ExHall A & F

Omni-AD: A Large-scale and Versatile Benchmark for Industrial Anomaly Detection

Dahu Shi ⋅ Chengshen He ⋅ Shaochen Zhang ⋅ Bo Qian ⋅ Xiaochen Quan ⋅ Wencong Zhang ⋅ Xing Wei

Abstract

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