Real-IAD MVN: A Multi-View Normal Vector Dataset and Benchmark for High-Fidelity Industrial Anomaly Detection
Wenbing Zhu, Jianing Liang, Linjie Cheng, Yurui Pan, Zhuhao Chen, Qingwang Yan, Yudong Cheng, Jianghui Zhang, Mingmin Chi, Bo Peng
Keywords:
Datasets and Evaluation
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